Menu

Presentazioni e Articoli Tecnici

Ricerca rapida

Risorse
White paper e Appunti applicativi

Measuring the Spectra of Metamaterials at an Oblique Incidence

X. Ni[1,2], Z. Liu[1,2], and A.V. Kildishev[1,2]
[1]School of Electrical and Computer Engineering, Purdue University, West Lafayette, Indiana, USA
[2]Birck Nanotechnology Center, Purdue University, West Lafayette, Indiana, USA
Published in 2009

The emergence of electromagnetic metamaterials has given rise to a variety of fascinating applications, including the perfect lens and the optical cloaking device. For a long time the study of the properties of metamaterials was limited to normal incidence only. However, it is extremely important to know the behavior of metamaterials especially in the area of imaging. In this paper, we use COMSOL Multiphysics to model a metamaterial structure at an oblique incidence.

Download